Charge Transport Mechanisms in Heavy-Ion Driven Leakage Current in Silicon Carbide Schottky Power Diodes

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ژورنال

عنوان ژورنال: IEEE Transactions on Device and Materials Reliability

سال: 2016

ISSN: 1530-4388,1558-2574

DOI: 10.1109/tdmr.2016.2557585